TOC for Microelectronics

Maximize water manufacturing yield and control your ultrapure water (UPW) quality

Ultrapure water is essential for semiconductor device fabrication. While achieving this purity is complex and expensive, it's critical for maintaining product quality and manufacturing standards.

Microelectronics manufacturers require precise monitoring across multiple purity levels - from low parts-per-million (ppm) concentrations in feedwater to parts-per-trillion (ppt) concentrations prior to final polishing. Additional complexity can arise when analyzing complex sample matrices for reclaim and wastewater applications.

As one of the world's most complex and precise processes, semiconductor manufacturing requires stringent control of high-purity water. Even trace contaminants can cause significant defects and reduce product yields, making total organic carbon (TOC) monitoring essential for contamination control.

But not all analytical tools are made equal. Instrumentation used for monitoring microelectronics applications must provide stable low-level performance, instrument-to-instrument matching, and excellent limit of detection. With Sievers Instruments, you will be confident you have the right technology for low-level detection of all organics, combined with minimal maintenance, ease of use, and reduced downtime